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6 - Behavioral modeling

Published online by Cambridge University Press:  05 July 2011

Patrick Roblin
Patrick Roblin
Affiliation:
Ohio State University
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Summary

Behavioral model for SISO and MIMO systems

In this chapter we will discuss various new techniques for the behavioral modeling of devices characterized by NVNA and VSA measurements. The reader is referred to the companion series book [1] for a comprehensive review of the field of behavioral modeling.

In our presentation we will focus on the development of single-input single-output (SISO) models. As shown in Figure 6.1(a) SISO models can be directly applied to single-port (two terminals) nonlinear loads or diodes. An example is the nonlinear negative resistance of an oscillator, which will be discussed in Chapter 7.

For the modeling of power amplifiers that are two-port devices (four terminals) a SISO model as shown in Figure 6.1(a) can be applied if we assume that the input and output ports are matched. That way, none of the reflected waves at the input b1(pω) from the device is converted into incident waves a1(pω) at port 1 and similarly none of the transmitted waves b2(pω) is converted into incident waves a2(pω) at port 2. A SISO model can also be applied to three-port modulator systems under similar approximations, as we shall see in Chapter 8.

The matching of the generator impedance and output load impedance to the characteristic impedance (typically 50 Ω) can be improved in practical systems by inserting attenuators or isolators at the input and output ports. Obviously, in the real world no device is perfect and some small reflections will still take place.

Type
Chapter
Information
Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
Interactive Measurement and Design Techniques
 , pp. 160 - 200
Publisher: Cambridge University Press
Print publication year: 2011

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References

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  • Behavioral modeling
  • Patrick Roblin, Ohio State University
  • Book: Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
  • Online publication: 05 July 2011
  • Chapter DOI: https://doi.org/10.1017/CBO9780511862663.008
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  • Behavioral modeling
  • Patrick Roblin, Ohio State University
  • Book: Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
  • Online publication: 05 July 2011
  • Chapter DOI: https://doi.org/10.1017/CBO9780511862663.008
Available formats
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Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

  • Behavioral modeling
  • Patrick Roblin, Ohio State University
  • Book: Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
  • Online publication: 05 July 2011
  • Chapter DOI: https://doi.org/10.1017/CBO9780511862663.008
Available formats
×