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21 - Spherical and Chromatic Aberration Correction for Atomic-Resolution Liquid Cell Electron Microscopy

from Part III - Prospects

Published online by Cambridge University Press:  22 December 2016

Frances M. Ross
Affiliation:
IBM T. J. Watson Research Center, New York
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Publisher: Cambridge University Press
Print publication year: 2016

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References

Scherzer, O., Über einige Fehler von Elektronenlinsen. Z. Phys., 101 (1936), 593603.CrossRefGoogle Scholar
Scherzer, O., The theoretical resolution limit of the electron microscope. J. Appl. Phys., 20 (1949), 2029.Google Scholar
Coene, W. and Jansen, A. J., Image delocalisation and high resolution tranmission electron microscopic imaging with a field emission gun. Scanning Microsc. Suppl., 6 (1992), 379403.Google Scholar
Cervera Gontard, L., Dunin-Borkowski, R. E., Hÿtch, M. J. and Ozkaya, D., Delocalisation in images of Pt nanoparticles. J. Phys. Conf. Ser., 26 (2006), 292295.Google Scholar
Coene, W. M. J., Thust, A., Op de Beeck, M. and van Dyck, D., Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy, 64 (1996), 109135.Google Scholar
Thust, A., Coene, W. M. J., Op de Beeck, M. and van Dyck, D., Focal-series reconstruction in HRTEM: simulation studies on nonperiodic objects. Ultramicroscopy, 64 (1996), 211230.Google Scholar
Kisielowski, C., Hetherington, C. J. D., Wang, Y. C. et al., Imaging columns of the light elements carbon, nitrogen and oxygen with sub angstrom resolution. Ultramicroscopy, 89 (2001), 243263.CrossRefGoogle ScholarPubMed
Cervera Gontard, L., Chang, L.-Y., Hetherington, C. J. D. et al., Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. Angew. Chem., 46 (2007), 36833685.Google Scholar
Haider, M., Rose, H., Uhlemann, S. et al., A spherical-aberration-corrected 200 kV transmission electron microscope. Ultramicroscopy, 75 (1998), 5360.Google Scholar
Lentzen, M., Jahnen, B., Jia, C. L. et al., High-resolution imaging with an aberration-corrected transmission electron microscope. Ultramicroscopy, 92 (2002), 233242.Google Scholar
Jia, C. L., Lentzen, M. and Urban, K., Atomic-resolution imaging of oxygen in perovskite ceramics. Science, 299 (2003), 870873.CrossRefGoogle ScholarPubMed
Jia, C. L., Mi, S. B., Urban, K. et al., Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films. Nat. Mater., 7 (2008), 5761.Google Scholar
Jia, C. L., Houben, L., Thust, A. and Barthel, J., On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM. Ultramicroscopy, 110 (2010), 500505.Google Scholar
Jia, C. L., Barthel, J., Gunkel, F. et al., Atomic-scale measurement of structure and chemistry of a single-unit-cell layer of LaAlO3 embedded in SrTiO3. Microsc. Microanal., 19 (2013), 310318.CrossRefGoogle ScholarPubMed
Jia, C. L., Mi, S.-B., Barthel, J. et al., Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image. Nat. Mater., 13 (2014), 10441049.CrossRefGoogle ScholarPubMed
Barthel, J. and Thust, A., Aberration measurement in HRTEM: implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns. Ultramicroscopy, 111 (2010), 2746.Google Scholar
Barthel, J. and Thust, A., On the optical stability of high-resolution transmission electron microscopes. Ultramicroscopy, 134 (2013), 617.Google Scholar
Hansen, T. W., Wagner, J. B. and Dunin-Borkowski, R. E., Aberration corrected and monochromated environmental transmission electron microscopy: challenges and prospects for materials science. Mater. Sci. Technol., 26 (2010), 13381344.CrossRefGoogle Scholar
Egerton, R. F., Electron Energy-Loss Spectroscopy in the Electron Microscope (New York: Springer, 2011).CrossRefGoogle Scholar
Boothroyd, C. B., Moreno, M. S., Duchamp, M. et al., Atomic resolution imaging and spectroscopy of barium atoms and functional groups on graphene oxide. Ultramicroscopy, 145 (2014), 6673.CrossRefGoogle ScholarPubMed
Zach, J., Chromatic correction: a revolution in electron microscopy? Phil. Trans. R. Soc. A, 367 (2009), 36993707.Google Scholar
Rose, H., Future trends in aberration corrected electron microscopy. Phil. Trans. R. Soc. A, 367 (2009), 38093823.Google Scholar
Kabius, B., Hartel, P., Haider, M. et al., First application of CC-corrected imaging for high-resolution and energy-filtered TEM. J. Electron Microsc., 58 (2009), 147155.Google Scholar
Leary, R. and Brydson, R., Chromatic aberration correction: the next step in electron microscopy. Adv. Imagi. Electron Phys., 165 (2011), 73130.Google Scholar
Haider, M., Hartel, P., Müller, H., Uhlemann, S. and Zach, J., Information transfer in a TEM corrected for spherical and chromatic aberration. Microsc. Microanal., 16 (2010), 393408.Google Scholar
Rose, H., Outline of an ultracorrector compensating for all primary chromatic and geometrical aberrations of charged-particle lenses. Nucl. Instrum. Methods Phys. Res. A, 519 (2004), 1227.Google Scholar
Rose, H., Prospects for aberration-free electron microscopy. Ultramicroscopy, 103 (2005), 16.Google Scholar
Haider, M., Müller, H., Uhlemann, S. et al., Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM. Ultramicroscopy, 108 (2008), 167178.Google Scholar
Uhlemann, S., Müller, H., Hartel, P., Zach, J. and Haider, M., Thermal magnetic field noise limits resolution in transmission electron microscopy. Phys. Rev. Lett., 111 (2013), 046101.Google Scholar
Urban, K. W., Mayer, J., Jinschek, J. R. et al., Achromatic elemental mapping beyond the nanoscale in the transmission electron microscope. Phys. Rev. Lett., 110 (2013), 185507.Google Scholar
Forbes, B. D., Houben, L., Mayer, J., Dunin-Borkowski, R. E. and Allen, L. J., Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy. Ultramicroscopy, 147 (2014), 98105.Google Scholar
Baudoin, J. P., Jinschek, J. R., Boothroyd, C. B., Dunin-Borkowski, R. E. and de Jonge, N., Chromatic aberration-corrected tilt series transmission electron microscopy of nanoparticles in a whole mount macrophage cell. Microsc. Microanal., 19 (2013), 814821.Google Scholar
Reimer, L. and Ross-Messemer, M., Top–bottom effect in energy-selecting TEM. Ultramicroscopy, 21 (1987), 385388.Google Scholar
Reimer, L. and Gentsch, P., Superposition of chromatic error and beam broadening in TEM of thick carbon and organic specimens. Ultramicroscopy, 1 (1975), 15.Google Scholar
Gentsch, P., Gilde, H. and Reimer, L., Measurement of the top–bottom effect in scanning transmission electron microscopy of thick amorphous specimens. J. Microsc., 100 (1974), 8192.CrossRefGoogle Scholar
Sousa, A. A., Hohmann-Marriott, M. F., Zhang, G. and Leapman, R. D., Monte Carlo electron-trajectory simulations in bright-field and dark-field STEM: implications for tomography of thick biological sections. Ultramicroscopy, 109 (2009), 213221.Google Scholar
Demers, H., Ramachandra, R., Drouin, D. and de Jonge, N., The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimens. Microsc. Microanal., 18 (2012), 582590.Google Scholar
Hyun, J. K., Ercius, P. and Muller, D. A., Beam spreading and spatial resolution in thick organic specimens. Ultramicroscopy, 109 (2008), 17.Google Scholar

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