Book contents
- Frontmatter
- Contents
- List of contributors
- Preface
- 1 High-resolution transmission electron microscopy
- 2 Holography in the transmission electron microscope
- 3 Microanalysis by scanning transmission electron microscopy
- 4 Specimen preparation for transmission electron microscopy
- 5 Low-temperature scanning electron microscopy
- 6 Scanning tunneling microscopy
- 7 Identification of new superconducting compounds by electron microscopy
- 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
- 9 Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
- 10 Grain boundaries in high Tc materials: transport properties and structure
- 11 The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7–δ
- 12 Microstructures in superconducting YBa2Cu3O7 thin films
- 13 Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
- 14 Controlling the structure and properties of high Tc thin-film devices
7 - Identification of new superconducting compounds by electron microscopy
Published online by Cambridge University Press: 21 August 2009
- Frontmatter
- Contents
- List of contributors
- Preface
- 1 High-resolution transmission electron microscopy
- 2 Holography in the transmission electron microscope
- 3 Microanalysis by scanning transmission electron microscopy
- 4 Specimen preparation for transmission electron microscopy
- 5 Low-temperature scanning electron microscopy
- 6 Scanning tunneling microscopy
- 7 Identification of new superconducting compounds by electron microscopy
- 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
- 9 Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
- 10 Grain boundaries in high Tc materials: transport properties and structure
- 11 The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7–δ
- 12 Microstructures in superconducting YBa2Cu3O7 thin films
- 13 Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
- 14 Controlling the structure and properties of high Tc thin-film devices
Summary
Introduction
It is clear that electron microscopy is not the most favourable technique for structure determination of new (superconducting) phases; X-ray diffraction and particularly neutron diffraction do a far better job in the ab initio structure determination. Electron microscopy and electron diffraction are extremely powerful however to determine the local structure; i.e. to detect deviations from the average structure, as determined by X-rays or neutrons. In this way several new phases have been first identified by electron microscopy; some of them have been later made into bulk superconductors. In other cases the identification of isolated defects in an existing material have inspired chemists to produce new superconducting materials; this was, for example, the case for the occurrence of double HgOδ layers in a one-layer Hg-1223 superconductor.
In the first part of this contribution we will focus on the well known YBa2Cu3O7–δ superconductor; this material allows a large number of substitutions without drastically altering its structural aspects, but with sometimes completely different physical properties. In the second part, we will concentrate on the more recent Hg-based superconductors and illustrate the extreme importance of the different electron microscopy techniques in the development of new superconducting compounds.
Oxygen vacancy order in the CuO plane of YBa2Cu3O7–δ
From a microstructural point of view, YBa2Cu3O7–δ is an interesting compound. It can assume variable oxygen contents (0 ≤ δ ≤ 1), ordered into various ordering schemes as observed abundantly by electron microscopy [7.1–7.16], and more recently by X-ray [7.17–7.19] and neutron diffraction [7.3]. Another important feature of the compound is its susceptibility to elemental substitutions, resulting again in a variety of oxygen ordered phases.
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- Publisher: Cambridge University PressPrint publication year: 2000
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