6 results
Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 8-9
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Electron Differential Phase Microscopy with an A-B Effect Phase Plate
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1945-1946
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Integrated Processing of Silicon Oxynitride Alloy Dielectrics by Plasma-Assisted Oxidation, Chemical Vapor Deposition, and On-Line Rapid Thermal Annealing
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 387 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 213
- Print publication:
- 1995
-
- Article
- Export citation
Silicon Oxynitride and Oxide-Nitride-Oxide Gate Dielectrics by Combined Plasma-Rapid Thermal Processing
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 342 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 169
- Print publication:
- 1994
-
- Article
- Export citation
Vocal fold sulcus
-
- Journal:
- The Journal of Laryngology & Otology / Volume 104 / Issue 11 / November 1990
- Published online by Cambridge University Press:
- 29 June 2007, pp. 876-878
- Print publication:
- November 1990
-
- Article
- Export citation
The Conversion from the B1950 FK4-Based Position to the J2000 Position of Celestial Objects
-
- Journal:
- Symposium - International Astronomical Union / Volume 109 / 1986
- Published online by Cambridge University Press:
- 04 August 2017, pp. 123-131
- Print publication:
- 1986
-
- Article
-
- You have access
- Export citation