7 results
Secondary Ion Mass Spectrometry in the TEM: Isotope Specific High Resolution Correlative Imaging.
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 316-317
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- July 2017
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SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2319-2320
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- August 2015
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Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1437-1438
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- August 2015
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Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 13-14
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- August 2015
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Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1859-1860
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- August 2015
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SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 966-967
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- August 2014
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A New Class of Representations of EALA Coordinated by Quantum Tori in Two Variables
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- Journal:
- Canadian Mathematical Bulletin / Volume 45 / Issue 4 / 01 December 2002
- Published online by Cambridge University Press:
- 20 November 2018, pp. 672-685
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- 01 December 2002
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