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Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics

Published online by Cambridge University Press:  23 September 2015

T. Wirtz ,
D. Dowsett  and
S. Eswara Moorthy
T. Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA),Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
D. Dowsett
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA),Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
S. Eswara Moorthy
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA),Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 13 - 14
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Wirtz, T., et al., Appl. Phys. Lett 101 (2012) 041601.Google Scholar
[2] Pillatsch, L., et al., Appl. Surf. Sci 282 (2013) 908.Google Scholar
[3] Wirtz, T., et al., Surf Interface Anal 45(1) (2013) 513–516.CrossRefGoogle Scholar
[4] Wirtz, T., et al., Rev. Sci. Instrum 83 (2012) 063702.Google Scholar
[5] Nguyen, C. L., et al., Appl. Surf. Sci 265 (2013) 489–494.CrossRefGoogle Scholar