4 results
Emission of partial dislocations in silicon under nanoindentation
-
- Journal:
- Journal of Materials Research / Volume 28 / Issue 15 / 14 August 2013
- Published online by Cambridge University Press:
- 22 July 2013, pp. 1995-2003
- Print publication:
- 14 August 2013
-
- Article
- Export citation
Variation of crystal quality and residual stresses in epitaxially grown thin film systems induced by ion implantation and annealing
-
- Journal:
- Journal of Materials Research / Volume 28 / Issue 11 / 14 June 2013
- Published online by Cambridge University Press:
- 14 May 2013, pp. 1413-1419
- Print publication:
- 14 June 2013
-
- Article
- Export citation
Effects of misfit dislocation and film-thickness on the residual stresses in epitaxial thin film systems: Experimental analysis and modeling
-
- Journal:
- Journal of Materials Research / Volume 27 / Issue 21 / 14 November 2012
- Published online by Cambridge University Press:
- 28 September 2012, pp. 2737-2745
- Print publication:
- 14 November 2012
-
- Article
- Export citation
Initiation of Dislocation Systems in Alumina Under Single-point Scratching
-
- Journal:
- Journal of Materials Research / Volume 14 / Issue 4 / April 1999
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1430-1436
- Print publication:
- April 1999
-
- Article
- Export citation