5 results
High Speed TEM Sample Preparation by Xe FIB
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 298-299
- Print publication:
- August 2014
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New Ultra-High Resolution SEM for Imaging by Low Energy Electrons
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1302-1303
- Print publication:
- August 2013
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Fast 3D Tomography of C4 Solder Bump by Using Xe Plasma Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 860-861
- Print publication:
- August 2013
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Combined plasma FIB-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 652-653
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- July 2012
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A New Solid State Photomultiplier Device for Electron Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 906-907
- Print publication:
- July 2011
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