7 results
Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1845-1846
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- August 2015
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Quantitative Measurement of Resolution as a Function of Defocus in Different Microscopy Modalities Using a Simplified Technique
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1711-1712
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- August 2015
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Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1617-1618
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- August 2015
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Localization and Number of Au Nanoparticles in Optically Indexed Cells by FIB Tomography
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 411-412
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- August 2015
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A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images
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- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 26 May 2015, pp. 771-777
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- June 2015
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Optimization of Focused Ion Beam-Tomography for Superconducting Electronics
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 772-773
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- August 2014
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Failure Analysis and Reliability of Low-Temperature-Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1762-1763
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- August 2014
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