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Quantitative Measurement of Resolution as a Function of Defocus in Different Microscopy Modalities Using a Simplified Technique

Published online by Cambridge University Press:  23 September 2015

Aric W. Sanders ,
Alexandra E. Curtin  and
Ryan Skinner

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1711 - 1712
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] "Scanning electron microscopy and X-ray microanalysis. A text for biologists, materials scientists, and geologists." Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Fiori, C. & Lifshin, E., (Plenum Publishing Corporation, New York, New York). p 4.Google Scholar
[2] Hecht, E. in "Optics". Addison and Wesley Inc.). New York, New York.Google Scholar
[3] Curtin, A E, Skinner, R & Sanders, A W, Microscopy and Microanalysis 20 (2014). p 984–985.Google Scholar