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Optimization of Focused Ion Beam-Tomography for Superconducting Electronics

Published online by Cambridge University Press:  27 August 2014

Aric Sanders ,
Anna Fox ,
Paul Dresselhaus  and
Alexandra Curtin
Aric Sanders
Affiliation:
Quantum Electronics and Photonics Division, National Institute of Standards and Technology, Boulder, Colorado 80305
Anna Fox
Affiliation:
Quantum Electronics and Photonics Division, National Institute of Standards and Technology, Boulder, Colorado 80305
Paul Dresselhaus
Affiliation:
Quantum Electronics and Photonics Division, National Institute of Standards and Technology, Boulder, Colorado 80305
Alexandra Curtin
Affiliation:
Quantum Electronics and Photonics Division, National Institute of Standards and Technology, Boulder, Colorado 80305

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 772 - 773
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Dresselhaus, P. D., et al, IEEE Transactions on Applied Superconductivity 21 no 3 (2011) p. 693-696.Google Scholar