5 results
The Sputtering Behavior of Polymeric Materials During Focused Ion Beam Nanomachining
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 206-207
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- July 2010
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Effect of Cleaning Parameters on Cleaning Effectiveness in an SEM Equipped with an RF Plasma Anti-Contamination Device
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1732-1733
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- August 2007
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A Wide Range of FIB Applications in a Multidisciplinary Analytical Facility
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1328-1329
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- August 2006
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Monitoring Contamination Rate in an SEM Equipped with an Evactron Anti-Contamination Device
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 204-205
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- August 2006
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Application of an Improved Mathematical Model to the Analysis of Cross-Sectional EBIC of GaN-Based LEDs
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 752-753
- Print publication:
- August 2006
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