Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-19T16:22:30.255Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of an Improved Mathematical Model to the Analysis of Cross-Sectional EBIC of GaN-Based LEDs

Published online by Cambridge University Press:  31 July 2006

CM Parish ,
CL Progl ,
AD Batchelor  and
PE Russell
CM Parish
Affiliation:
North Carolina State University
CL Progl
Affiliation:
North Carolina State University
AD Batchelor
Affiliation:
North Carolina State University
PE Russell
Affiliation:
North Carolina State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 752 - 753
Copyright
© 2006 Microscopy Society of America