Technical Articles
Synthesis, crystal structure and vibrational spectra of Sr0.5Zr2(AsO4)3
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- 29 February 2012, pp. 200-204
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X-Ray Diffraction
Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements
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- 20 May 2016, pp. 85-88
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Technical Articles
Debye temperature of 4H-SiC determined by X-ray powder diffraction
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- 29 February 2012, pp. 311-314
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Methods For Residual Stress Analysis
Why we should give up the sin2ψ method
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- 06 March 2012, pp. S16-S21
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Technical Articles
A rapid method for quantifying single mineral phases in heterogeneous natural dusts using X-ray diffraction
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- 29 February 2012, pp. 17-23
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Methods For Residual Stress Analysis
Finite element modeling of residual stress profile patterns in hard turning
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- 06 March 2012, pp. S22-S25
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Technical Articles
Synthesis and characterization of zinc sulfide hollow microspheres
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- 29 February 2012, pp. 24-28
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Texture and structural refinement using neutron diffraction data from molybdite (MoO3) and calcite (CaCO3) powders and a Ni-rich Ni50.7Ti49.30 alloy
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- 29 February 2012, pp. 315-326
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X-Ray Diffraction
Natural nanoparticle structure, properties and reactivity from X-ray studies
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- 29 February 2012, pp. 89-93
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Technical Articles
Influence of the X-ray diffraction line profile analysis method on the structural and microstructural parameters determination of sol-gel TiO2 powders
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- 29 February 2012, pp. 205-220
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Synthesis and crystal structure refinement by the Rietveld method of antimony-bearing titanite Ca(Ti0.6Al0.2Sb0.2)OSiO4
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- 29 February 2012, pp. 221-227
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Methods For Residual Stress Analysis
Evaluation of substructure parameters by peak profile analysis of high-resolution neutron diffraction spectra
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- 06 March 2012, pp. S26-S30
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New Diffraction Data
New powder diffraction data of some derivatives of N-(hydroxyalkyl)-4-chlorophenoxyacetamide—Potential pesticides
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- 29 February 2012, pp. 327-336
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X-Ray Diffraction
In situ stress analysis of multilayer environmental barrier coatings
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- 29 February 2012, pp. 94-98
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New Diffraction Data
X-ray powder diffraction data for high-temperature Al4Re(Ni)
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- 29 February 2012, pp. 29-31
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X-ray diffraction data of tibolone Δ4 isomer (isotibolone)
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- 29 February 2012, pp. 337-342
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Technical Articles
Dislocations, crystallite size, and planar faults in nanocrystalline ceria
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- 29 February 2012, pp. 228-233
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Methods For Residual Stress Analysis
The extent of relaxation of weld residual stresses on cutting out cross-weld test-pieces
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- 06 March 2012, pp. S31-S36
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New Diffraction Data
X-ray powder diffraction data for alaptide, 8(S)-methyl-6,9-diazaspiro/4,5/decane-7,10-dione or cyclo(L-Alanyl-1-ami-no-1-cyclopentan carbonyl), cyclo(L-Ala-Acp)
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- 29 February 2012, pp. 32-34
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X-Ray Diffraction
X-ray diffraction study of anisotropic state of residual stress after down-cut and up-cut face grinding
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- 29 February 2012, pp. 99-101
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