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F61 Using a monochromatic-excitation EDXRF analyzer to measure trace elements in air particulates

Published online by Cambridge University Press:  20 May 2016

N. Gao ,
Z. Chen  and
W. M. Gibson
N. Gao
Affiliation:
X-ray Optical Systems, Inc., East Greenbush, NY
Z. Chen
Affiliation:
X-ray Optical Systems, Inc., East Greenbush, NY
W. M. Gibson
Affiliation:
X-ray Optical Systems, Inc., East Greenbush, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 176
Copyright
Copyright © Cambridge University Press 2006

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