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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 8
Dislocations, crystallite size, and planar faults in nanocrystalline ceria
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- Published online by Cambridge University Press:
- 29 February 2012, pp. 228-233
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- Cited by 8
EXPO2011: A new package for powder crystallography
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- Published online by Cambridge University Press:
- 06 March 2012, pp. S2-S12
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Metal hydride formation in palladium and palladium rich intermetallic compounds studied by in situ neutron diffraction
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- 14 November 2013, pp. S242-S255
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Microstrain accumulation in multiphase superalloys
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- 06 March 2012, pp. S65-S67
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A powder diffraction study of MIBaIn2(PO4)3 (MI=Na, K, Cs) with a langbeinite-type structure
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- 05 March 2012, pp. 1-6
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Determination of Crystal Structure of Cd3(BO3)2 by Powder X-Ray Diffraction
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- 10 January 2013, pp. 28-30
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Size and spatial correlation of defective domains in yttrium-doped CeO2
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- 22 May 2015, pp. S119-S126
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- Cited by 8
A Rietveld refinement investigation of a Mg-stabilized triclinic tricalcium silicate using synchrotron X-ray powder diffraction data
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- 05 March 2012, pp. 356-358
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The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides
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- 06 March 2019, pp. 471-486
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Fundamentals of X-ray Spectrometric Analysis Using Low-Energy Electron Excitation
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- 06 March 2019, pp. 105-121
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Europium nitride synthesized by direct nitridation with ammonia
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- 01 March 2012, pp. 40-42
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Powder X-ray diffraction of oriented and intercalated lead iodide
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- 05 March 2012, pp. 16-19
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New powder diffraction data for dimorphic KHF2
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- 10 January 2013, pp. 121-122
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X-ray-diffraction study of solid C70
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- 10 January 2013, pp. 5-6
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The Linear Coefficient of Thermal Expansion of Silicon at Room Temperature
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- 10 January 2013, pp. 147-152
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Simultaneous measurements of X-ray diffraction (XRD) and differential scanning calorimetry (DSC) data under controlled humidity condition: Instrumentation and application to studies on hydration, dehydration, and rehydration processes of pharmaceutical compounds
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- 06 March 2012, pp. 31-35
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Some Notes on Ultrasoft X-Ray Fluorescence Analysis—10 to 100 Å Region*
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- 06 March 2019, pp. 269-284
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X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers
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- 29 February 2012, pp. 99-103
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Clay mineral analysis by automated powder diffraction analysis using the whole diffraction patterna)
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- 05 March 2012, pp. 181-185
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Comparison methods of variance and line profile analysis for the evaluation of microstructures of materials
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- 29 February 2012, pp. 41-51
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