Company Profile
ASI/Applied Scientific Instrumentation Inc.
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- 07 March 2017, p. 5
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DIATOME U.S.
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- 07 March 2017, p. 6
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Electron Microscopy
Tunable Substrates Improve Imaging of Viruses and Cancer Proteins
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- 06 July 2017, pp. 22-27
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Interactive Nanoscale Measurements
From Image Tiles to Web-Based Interactive Measurements in One Stop
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- 04 January 2017, pp. 18-27
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Scanning Electron Microscopy
A Software Approach to Improving SEM Resolution, Image Quality, and Productivity
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- 03 May 2017, pp. 18-25
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Light Microscopy
Thermal Analysis by Structural Characterization (TASC): Structural and Thermo-Rheological Information from Hot Stage Microscopy
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- 31 August 2017, pp. 18-23
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X-ray Microanalysis
Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM
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- 06 March 2017, pp. 20-29
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Scanning Probe Microscopy
CoreAFM: Research-Grade AFM Platform with Application Modularity
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- 27 October 2017, pp. 20-25
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Cryo-Electron Microscopy
Charting Molecular Landscapes Using Cryo-Electron Tomography
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- 03 May 2017, pp. 26-31
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Microanalysis
Homogeneity Testing at the Micrometer Scale
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- 04 January 2017, pp. 28-35
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Electron Microscopy
Some Interesting Facts About Vacuum Pumps and Rate of Evacuation
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- 06 July 2017, pp. 28-33
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Light Microscopy
Less is More: Longer Exposure Times with Low Light Intensity is Less Photo-Toxic
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- 27 October 2017, pp. 26-35
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X-ray Microanalysis
Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector
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- 06 March 2017, pp. 30-35
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Company Profile
Electron Microscopy Sciences
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- Published online by Cambridge University Press:
- 07 March 2017, p. 7
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Light Microscopy
Practical Guide to Choosing a Microscope Camera
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- 31 August 2017, pp. 24-29
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Company Profile
Gatan
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- Published online by Cambridge University Press:
- 07 March 2017, p. 8
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Electron Microscopy
Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
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- 27 October 2017, pp. 36-41
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X-ray Microanalysis
Large-Area Quantitative Phase Mapping in the Scanning Electron Microscope
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- 06 March 2017, pp. 36-45
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Microanalysis
Characterization of Glass Delamination by TEM: Results from a New Sample Preparation Technique
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- 04 January 2017, pp. 36-41
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Electron Microscopy
Anatomy of an Alveolar Type II Cell Diagram
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- 31 August 2017, pp. 30-35
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