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3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

David Ren ,
Colin Ophus ,
Jihan Zhou ,
Hannah DeVyldere ,
Michael Whittaker ,
Benjamin Gilbert ,
Jillian Banfield ,
Mary Scott ,
Jianwei Miao  and
Laura Waller
David Ren
Affiliation:
University of California-Berkeley, Berkeley, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Jihan Zhou
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
Hannah DeVyldere
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Michael Whittaker
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Benjamin Gilbert
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Jillian Banfield
Affiliation:
University of California-Berkeley, Berkeley, California, United States
Mary Scott
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Jianwei Miao
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
Laura Waller
Affiliation:
University of California-Berkeley, Berkeley, California, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 932 - 933
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Copyright
Copyright © Microscopy Society of America 2020

References

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Ren, D et al. , Ultramicroscopy 208 (2020), 112860.10.1016/j.ultramic.2019.112860CrossRefGoogle Scholar