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Filling in the Missing Wedge with Aberration-corrected Electron Tomography

Published online by Cambridge University Press:  30 July 2020

Robert Hovden
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Reed Yalisove
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Jonathan Schwartz
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Suk Hyun Sung
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Yi Jiang
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Peter Ercius
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Copyright
Copyright © Microscopy Society of America 2020

References

Crowther, R., DeRosier, D., Klug, A., Proc. R. Soc. A 317, 319340 (1970)Google Scholar
Candes, E., Romber, J., and Tao, T., IEEE Trans. Inf. Theor. 52, 489 (2006)10.1109/TIT.2005.862083CrossRefGoogle Scholar
Saghi, Z., Holland, D.J., Leary, R., Falqui, A., Bertoni, G., Sederman, A.J., Gladden, L.F., Midgley, P.A., Nano Lett., 11, 4666 (2011).10.1021/nl202253aCrossRefGoogle Scholar
Goris, B., Bals, S., Van den Broek, W., Carbó-Argibay, E., Gómez-Graña, S., Liz-Marzán, L.M., Van Tendeloo, G., Nat. Mater., 11, 930 (2012).10.1038/nmat3462CrossRefGoogle Scholar
Jiang, Y., Hovden, R., Muller, D.A., Elser, V., Microsc. Microanal. 20 (6), 796 (2014)10.1017/S1431927614005704CrossRefGoogle Scholar
Schwartz, J., Jiang, Y., Wang, Y., Aiello, A., Bhattacharya, P., Yuan, H., Mi, Z., Bassim, N., Hovden, R., Microsc. Microanal. 25 (3), 705 (2019)10.1017/S1431927619000254CrossRefGoogle Scholar
Hovden, R., Ercius, P., Jiang, Y., Wang, D., Yu, Y., Abruña, H.D., Elser, V., Muller, D.A., Ultramicroscopy 140, 26 (2014).10.1016/j.ultramic.2014.01.013CrossRefGoogle Scholar
Yalisove, R., Sung, S. H., Hovden, R., Microsc. Microanal. 25 (Suppl 2), 1810 (2019)10.1017/S1431927619009784CrossRefGoogle Scholar
Ophus, C., Advanced Structural and Chemical Imaging 3, 13 (2017)10.1186/s40679-017-0046-1CrossRefGoogle Scholar