Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-26T03:40:30.033Z Has data issue: false hasContentIssue false
  • English
  • Français

A Modified Mean Atomic Number Background Correction Using Off-Peak Interpolated Measurements

Published online by Cambridge University Press:  30 July 2020

Omero Orlandini ,
John Donovan  and
Benjamin Hanson
Omero Orlandini
Affiliation:
University of Texas at Austin, Austin, Texas, United States
John Donovan
Affiliation:
University of Oregon, Eugene, Oregon, United States
Benjamin Hanson
Affiliation:
Corning Research and Development Corp., Corning, New York, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 508 - 509
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Donovan, JJ and Tingle, T, Journal of Microscopy and Microanalysis 2 (1996) p. 1.10.1017/S1431927696210013CrossRefGoogle Scholar
Donovan, JJ, Singer, JW and Armstrong, JT (2016) “A New EPMA Method for Fast Trace Element Analysis in Simple Matrices”, American Mineralogist, v101, p1839–185310.2138/am-2016-5628CrossRefGoogle Scholar