Microscopy and Microanalysis: Volume 13 -

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Volume 13 - September 2007

Contents

Page 9 of 60

Microscopy in Nanotechnology

Research Article

Investigation of Compositional Distribution During the Chemical Synthesis of FePt Nanoparticles
C Srivastava, H Bagaria, J Balasubramanian, D Nikles, D Johnson, H Turner, J Wiest, G Thompson
Published online by Cambridge University Press:

05 August 2007, pp. 68-69
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Research Article

Chemical Patterning and Chemical Contrast Imaging with the Tip of an Atomic Force Microscope
T Schimmel
Published online by Cambridge University Press:

07 September 2007, pp. 70-71
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.

Microscopy in Nanotechnology

Research Article

Direct Imaging of Ge-nanodot (001) Surface on Faintly Oxidized Si (111) Surfaces
C Sung-Pyo, K Shinji, T Nobuo
Published online by Cambridge University Press:

05 August 2007, pp. 70-71
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Triboelectricity of Toner Particles Studied by Electron Holography with Double Electric Shields
D Shindo, H Okada, Y Murakami, H Kawase, T Oikawa
Published online by Cambridge University Press:

05 August 2007, pp. 72-73
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Research Article

Imaging Magnetic Nanostructures by Resonant X-Ray Holography
S Eisebitt
Published online by Cambridge University Press:

07 September 2007, pp. 72-73
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Characterization of a 4-Quadrant-Large-Angles BSE-Detector for in-situ 3D Quantitative Analysis of the Sample Morphology in SEM
D Berger
Published online by Cambridge University Press:

07 September 2007, pp. 74-75
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

Quantitatively Exploring the Mechanical Behavior of Si Nanowires inside a TEM
ZW Shan, LL Cao, D Gao, AM Minor, SA S Asif, OL Warren
Published online by Cambridge University Press:

05 August 2007, pp. 74-75
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

In-situ Structure and Property Correlation in Carbon Nanotubes by using a Transmission Electron Microscopy-Scanning Tunneling Microscopy Platform
J Huang
Published online by Cambridge University Press:

05 August 2007, pp. 76-77
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Research Article

Non-conductive sample charging in SEM and ESEM
H-J Fitting, M Touzin, N Cornet, D Goeuriot, D Juvé, C Guerret-Piécourt
Published online by Cambridge University Press:

07 September 2007, pp. 76-77
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Strategies for Collection of Secondary Electrons in the SEM
I Konvalina, M Hovorka, P Wandrol, F Mika, I Müllerová
Published online by Cambridge University Press:

07 September 2007, pp. 78-79
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

In Situ Observations for Selective Synthesis of One-Dimensional Nanomaterials
R Sharma, S Hofmann
Published online by Cambridge University Press:

05 August 2007, pp. 78-79
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

High Resolution Microscopy Approaches for Phase-Change Random Access Memory (PRAM)
SA Song
Published online by Cambridge University Press:

05 August 2007, pp. 80-81
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Research Article

High-Resolution Scanning Electron Microscope for Mass Determination: Progress in the Development of a New Nanoanalytical Tool
V Krzyzanek, R Reichelt
Published online by Cambridge University Press:

07 September 2007, pp. 80-81
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Time Resolved Measurements of Ion- and Electron Currents in an ESEM
J Wagner, J Rattenberger, H Schröttner, M Schaffer, S Mitsche, A Zankel
Published online by Cambridge University Press:

07 September 2007, pp. 82-83
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

From 3D Imaging of Atoms to Macroscopic Device Properties
S Pennycook, K van Benthem, M Oxley, S Rashkeev, ST Pantelides
Published online by Cambridge University Press:

05 August 2007, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Advances in high-resolution electron microscopy

Research Article

High Resolution Electron Microscopy of Bimetallic Nanoparticles
D Ferrer, A Torres-Castro, DA Blom, LF Allard, M José-Yacamán
Published online by Cambridge University Press:

05 August 2007, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Research Article

Problems of the YAP:Ce Scintillator Use in Detectors of Signal Electrons in SEM.
P Wandrol, P Horák
Published online by Cambridge University Press:

07 September 2007, pp. 84-85
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Answering questions in materials science using FIB/SEM dual beam methods
C Holzapfel, F Soldera, F Mücklich
Published online by Cambridge University Press:

07 September 2007, pp. 86-87
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Advances in high-resolution electron microscopy

Research Article

Prospects for Three-Dimensional, Sub-Nanometer Imaging with Aberration-Corrected ADF-STEM
DA Muller, V Intaraprasonk, H Xin, P Ercius
Published online by Cambridge University Press:

05 August 2007, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization of Magnetic Recording Devices Using a JEOL 2200FS Aberration-Corrected STEM/TEM
D Yaney
Published online by Cambridge University Press:

05 August 2007, pp. 88-89
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 9 of 60

Microscopy and Microanalysis

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Volume 13 - September 2007

Microscopy in Nanotechnology

Research Article

Research Article

Microscopy in Nanotechnology

Research Article

Research Article

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

Research Article

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

Research Article

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

Advances in high-resolution electron microscopy

Research Article

Research Article

Advances in high-resolution electron microscopy

Research Article