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Chemical Patterning and Chemical Contrast Imaging with the Tip of an Atomic Force Microscope

Published online by Cambridge University Press:  07 September 2007

T Schimmel
T Schimmel*
Affiliation:
University of Karlsruhe and Forschungszentrum Karlsruhe, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 70 - 71
Copyright
Copyright © Microscopy Society of America 2007

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