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New Tool for In-Situ Lift Out of TEM Samples
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- 07 September 2007, pp. 88-89
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EBSD: Traditional and Advanced Applications
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Phase Identification in Nb-Cr-Si Alloys
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- 05 August 2007, pp. 90-91
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Investigation of Additional Thermally Induced Crystallisation in Amorphous Mg65Cu25Y10 Ribbon Material during Different TEM Preparation Procedures
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- 07 September 2007, pp. 90-91
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Novel double-wedge sample preparation technique for quantitative TEM analysis of 3D structure in thin films and at buried interfaces
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- 07 September 2007, pp. 92-93
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EBSD: Traditional and Advanced Applications
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EBSD Investigations of Equal Channel Angular Extruded Copper
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- 05 August 2007, pp. 92-93
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Structural analysis of cell-mineral aggregates in geomicrobiological samples by SEM
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- 07 September 2007, pp. 94-95
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Electron Crystallography and Precession Electron Diffraction
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Electron Precession: Past, Present and Future
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- 05 August 2007, pp. 94-95
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Measurement of Carbon Layer Thickness with EPMA and the Thin Film Analysis Software STRATAGem
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- 07 September 2007, pp. 96-97
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Electron Crystallography and Precession Electron Diffraction
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Aberration-corrected Precession Electron Diffraction
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- 05 August 2007, pp. 96-97
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Characterization of Oxides
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Microstructural Evolution of CeO2 Nano-Island Films and Its Influence on Physical Properties of CeO2/YBa2Cu3O7 Multilayers
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- 05 August 2007, pp. 98-99
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Using Enhanced SE Signal in the SEM for TEM Sample Thickness Determination
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- 07 September 2007, pp. 98-99
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Conventional TEM Investigation Of The FIB Damage In Copper
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- 07 September 2007, pp. 100-101
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Characterization of Oxides
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Electron Microscopy Study of Novel Ru Doped La0.8Sr0.2CrO3 as Anode Materials for Solid Oxide Fuel Cells (SOFCs)
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- 05 August 2007, pp. 100-101
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Influence of FIB-acceleration Voltage on Lateral Damage of Silicon based TEM samples
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- 07 September 2007, pp. 102-103
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Characterization of Oxides
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Characterization of Au-based Catalysts Using Novel Cerium Oxide Supports
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- 05 August 2007, pp. 102-103
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Large Chamber Scanning Electron Microscopy
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Wear Characterization of Forging Dies Using a Large-Chamber Scanning Electron Microscope
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- 05 August 2007, pp. 104-105
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FIB Preparation of Holes with Large Aspect Ratio
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- 07 September 2007, pp. 104-105
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Large Chamber Scanning Electron Microscopy
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Evaluating Expanded Polymers Using a Variable Pressure Large-Chamber Scanning Electron Microscope
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- 05 August 2007, pp. 106-107
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Electron Tomography of Unstained Cell Sections Using a Half-Plane (Hilbert) Phase Plate
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- 07 September 2007, pp. 106-107
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Quantification and Classification of Complex Microstructures by means of FIB/SEM-Nanotomography
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- 07 September 2007, pp. 108-109
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