Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T16:49:42.888Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration-corrected Precession Electron Diffraction

Published online by Cambridge University Press:  05 August 2007

CS Own ,
N Dellby ,
O Krivanek ,
LD Marks  and
M Murfitt
CS Own
Affiliation:
Nion Company
N Dellby
Affiliation:
Nion Company
O Krivanek
Affiliation:
Nion Company
LD Marks
Affiliation:
Northwestern University
M Murfitt
Affiliation:
Nion Company
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 96 - 97
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)