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Using Enhanced SE Signal in the SEM for TEM Sample Thickness Determination

Published online by Cambridge University Press:  07 September 2007

A Graff ,
M Simon  and
F Altmann
A Graff
Affiliation:
Fraunhofer Institute for Mechanics of Materials IWMH Halle, Germany
M Simon
Affiliation:
Fraunhofer Institute for Mechanics of Materials IWMH Halle, Germany
F Altmann
Affiliation:
Fraunhofer Institute for Mechanics of Materials IWMH Halle, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 98 - 99
Copyright
Copyright © Microscopy Society of America 2007

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