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Thermal Stability of Co-Fe and Cu Multilayered Thin Films

Published online by Cambridge University Press:  06 August 2003

Peter F. Ladwig ,
Jesse D. Olson ,
Joseph H. Bunton ,
David J. Larson ,
Martin C. Bonsager ,
Robert M. Ulfig ,
Richard L. Martens ,
Y. Austin Chang ,
Edward Oltman  and
Tye T. Gribb
...Show all authors
Peter F. Ladwig
Affiliation:
Materials Science Program, University of Wisconsin-Madison, 1509 University Avenue, Madison, WI 53706
Jesse D. Olson
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Joseph H. Bunton
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
David J. Larson
Affiliation:
Recording Head Operations, Seagate Technology, 7801 Computer Avenue, Bloomington, MN 55435
Martin C. Bonsager
Affiliation:
Recording Head Operations, Seagate Technology, 7801 Computer Avenue, Bloomington, MN 55435
Robert M. Ulfig
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Richard L. Martens
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Y. Austin Chang
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Edward Oltman
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Tye T. Gribb
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Thomas F. Kelly
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719
Allan E. Schultz
Affiliation:
Recording Head Operations, Seagate Technology, 7801 Computer Avenue, Bloomington, MN 55435
Bharat B. Pant
Affiliation:
Recording Head Operations, Seagate Technology, 7801 Computer Avenue, Bloomington, MN 55435

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 48 - 49
Copyright
Copyright © Microscopy Society of America 2003