Abstract
Modern Electron Microscopy Applications In The Consumer Products Industry
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- 06 August 2003, pp. 156-157
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Considerations on the accuracy of lattice parameters determined from HRTEM images
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- 05 September 2003, pp. 166-167
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Microscopy in Bioresponse Preparedness and Detection of Pathogens of Public Health Importance
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- 01 August 2003, pp. 158-159
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Emission Electron Microscopy of Nanoparticles in Strong fs Laser Fields
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- 05 September 2003, pp. 168-169
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Use of Microscopical Techniques in Failure Analysis and Defect Control in Automotive Castings
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- 06 August 2003, pp. 160-161
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Raman Spectroscopy as a Clinical Tool for Analysis and Diagnosis of Disease
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- 31 July 2003, pp. 162-163
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TEM Study of Wear Debris of Brake Linings
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- 05 September 2003, pp. 170-171
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Raman, Hyper-Raman, Hyper-Rayleigh and Two-Photon Excited Luminescence Microspectroscopy in an Optical Tweezers System
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- 06 August 2003, pp. 164-165
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Self-consistent Quasi-electrostatic Approach in Near-field Optical Microscopy of Quantum Dots Ensemble Embedded in Layer Structure
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- 05 September 2003, pp. 172-173
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Electron Holography of Nanomter-sized Magnetite Crystals
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- 05 September 2003, pp. 174-175
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Abstract
Pigment Identification, Raman Microscopy and the Arts/Science Interface : A Tribute to Walter McCrone
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- 06 August 2003, pp. 166-167
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Electrical and emission properties of current-carrying silver nanocluster films investigated by emission electron microscopy
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- 05 September 2003, pp. 176-177
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Micromachined Platforms for Microscopic Measurements
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- 01 August 2003, pp. 168-169
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Analytical TEM Investigations of B-doped Carbon and BN Nanotubes
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- 05 September 2003, pp. 178-179
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Second Harmonic Imaging Microscopy
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- 06 August 2003, pp. 170-171
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Imaging Blood-Brain Barrier Breakdown Using Multi-Photon Confocal Microscopy
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- 06 August 2003, pp. 172-173
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Metal Filled Carbon Nanotubes an Analytical TEM Study
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- 05 September 2003, pp. 180-181
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The State of the Art in Cryo-Electron Tomography
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- 16 July 2003, pp. 174-175
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What determines the structure of GeSi nanocrystals embedded in polytypic SiC?
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- 05 September 2003, pp. 182-183
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Novel Nanoscale Tomography Modes in Materials Science
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- 01 August 2003, pp. 176-177
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