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Lattice Tilt Mapping using Full Field Diffraction X-Ray Microscopy at ID01 ESRF

Published online by Cambridge University Press:  10 August 2018

Tao Zhou ,
Tomas Stankevic ,
Andrea Troian ,
Zhe Ren ,
Zhaoxia Bi ,
Jonas Ohlsson ,
Lars Samuelson ,
Jan Hilhorst ,
Tobias Schulli  and
Anders Mikkelsen
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Tao Zhou
Affiliation:
European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000Grenoble, France
Tomas Stankevic
Affiliation:
MAX IV Laboratory, Fotongatan 2, 225 92Lund, Sweden
Andrea Troian
Affiliation:
Lund University, Box 117, SE-221 00Lund, Sweden
Zhe Ren
Affiliation:
Lund University, Box 117, SE-221 00Lund, Sweden
Zhaoxia Bi
Affiliation:
Lund University, Box 117, SE-221 00Lund, Sweden
Jonas Ohlsson
Affiliation:
Lund University, Box 117, SE-221 00Lund, Sweden
Lars Samuelson
Affiliation:
Lund University, Box 117, SE-221 00Lund, Sweden
Jan Hilhorst
Affiliation:
European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000Grenoble, France
Tobias Schulli
Affiliation:
European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000Grenoble, France
Anders Mikkelsen
Affiliation:
Lund University, Box 117, SE-221 00Lund, Sweden
Olivier Balmes
Affiliation:
MAX IV Laboratory, Fotongatan 2, 225 92Lund, Sweden

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 126 - 127
Copyright
© Microscopy Society of America 2018 

References

[1] Hilhorst, J., et al, J. Appl Crystal 47, 1882 2014.Google Scholar
[2] Marschall, F., et al, Opt. Express 24, 10880 2016.Google Scholar
[3] Niese, S., et al, Opt. Express 22, 20008 2014.Google Scholar
[4] Bi, Z., et al, J. Appl. Phys. 123, 25102 2018.Google Scholar