Analytical and Instrumentation Science Symposia
Big, Deep, and Smart Data in Microscopy
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Acquisition and Fast Analysis of Multi-Dimensional STEM Data
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 168-169
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Reconstruction of Randomly and Partially Sampled STEM Spectrum-Images
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 170-171
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Robust Nanostructure from High Throughput Powder Diffraction Data
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 172-173
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Statistical Analyses of Electron Nanodiffraction Patterns to Examine Order and Structural Variability in Amorphous Materials
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- 04 August 2017, pp. 174-175
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Multivariate Statistical Analysis of a Multimodal Diffraction and X-ray Spectral Series Data Set
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- 04 August 2017, pp. 176-177
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Leveraging First Principles Modeling and Machine Learning for Microscopy Data Inversion
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- 04 August 2017, pp. 178-179
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Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection
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- 04 August 2017, pp. 180-181
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Autonomous Experimentation Applied to Carbon Nanotube Synthesis
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- Published online by Cambridge University Press:
- 04 August 2017, p. 182
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G-mode - Full Information Capture Applied to Scanning Probe Microscopy
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- 04 August 2017, pp. 184-185
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Combinatorial Microscopy in Liquids with Low Energy Electrons
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 186-187
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Physics-Based Image Reconstruction of SiC Grain Boundaries
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 188-189
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What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detectors?
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 190-191
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Rapid Measurement of I-V Curves via Complete Information Acquisition
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- 04 August 2017, pp. 192-193
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Separation of Hard to Distinguish Phases in Automated Feature Analysis
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 194-195
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Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 196-197
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Supervised Component Analysis for EELS Mapping
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 198-199
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Processing a Five Dimensional X-ray Image: Big Data Challenges and Opportunities
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 200-201
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Inter-phase Relationships Revealed in 3-Dimensional Orientation Spaces
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 202-203
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In Situ Transmission Electron Microscopy Graphene Liquid Cell on Chemical Sodiation of Nickel Oxide Nanoparticle
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- 04 August 2017, pp. 204-205
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Advances in Programming of Quantitative Microscopy for Biological and Materials Science
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Recent Advances of the Open Source MULTEM Program to Provide Accurate and Fast Electron Microscopy Simulations
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 206-207
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