Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Compressive Sensing, Machine Learning & Advanced Computation in Microscopy

Abstract

Resolution Versus Error for Computational Electron Microscopy

Spatial Resolution Smaller Than the Pixel Size? Yes we can!

Design and Development of Coded Aperture Compressive Sensing Acquisition for High Frame Rate TEM Imaging

Phase Imaging: A Compressive Sensing Approach

Acquisition of STEM Images by Adaptive Compressive Sensing

Controlling the Reaction Process in Operando STEM by Pixel Sub-Sampling

An Information Theoretic Approach for Creating 3D Spatial Images from 4D Time Series Data

Computer Vision Techniques Applied to the Reconstruction of the 3-D Structure Dislocations

A Framework to Learn Physics from Atomically Resolved Images

Denoising Electron-energy Loss Data Using Non-local Means Filters

Compressive Classification for TEM-EELS

A Method for Separating Crystallograpically Similar Phases in Steels using EBSD and Machine Learning

Sparsity, Parsimony and Data Reduction - Applications across Multi-Dimensional Electron Microscopy

Scanning Precession Electron Diffraction Study of Hybrid Precipitates in a 6xxx Series Aluminium Alloy

Data Clustering and Scanning Precession Electron Diffraction for Microanalysis

Combining a Convolutional Neural Network and Watershed Segmentation for Identifying U-Bearing Particles in Secondary Ion Mass Spectrometry Images

A Convolutional Neural Network Approach to Thickness Determination using Position Averaged Convergent Beam Electron Diffraction

3D Deconvolution for Cryo-Scanning Transmission Electron Tomography

Scanning Electron Microscope Point Spread Function Determination Through the Use of Particle Dispersions

Viability of Point Spread Function Deconvolution for SEM

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Compressive Sensing, Machine Learning & Advanced Computation in Microscopy

Abstract