Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-26T15:52:55.210Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid Measurement of I-V Curves via Complete Information Acquisition

Published online by Cambridge University Press:  04 August 2017

S. Somnath ,
P. Maksymovych ,
S. V. Kalinin ,
S. Jesse  and
R. K. Vasudevan
S. Somnath
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
P. Maksymovych
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
S. V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
S. Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
R. K. Vasudevan
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 192 - 193
Copyright
© Microscopy Society of America 2017 

References

[1] Belianinov, A, Kalinin, SV & Jesse, S Nat. Commun. 6 2015). p. 6650.Google Scholar
[2] Meyer, R, et al, Appl. Phys. Lett. 86 2005). p. 142907.CrossRefGoogle Scholar
[3] Martin, S, et al, Rev. Sci. Instr. 88 2017). p. 023901.Google Scholar
[4] Komoto, Y, et al, Scientific Reports 6 2016). p. 26606.Google Scholar
[5] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE (RKV, SVK, PM, SS). This research was conducted and partially supported (SJ) at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar