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Physics-Based Image Reconstruction of SiC Grain Boundaries

Published online by Cambridge University Press:  04 August 2017

Amirkoushyar Ziabari ,
Charles A. Bouman ,
Jeffrey M. Rickman  and
Jeff. P. Simmons
Amirkoushyar Ziabari
Affiliation:
Electrical and Computer Engineering (ECE), Purdue University, West Lafayette, IN, USA.
Charles A. Bouman
Affiliation:
Electrical and Computer Engineering (ECE), Purdue University, West Lafayette, IN, USA.
Jeffrey M. Rickman
Affiliation:
Department of Material Science and Engineering, Lehigh University, Bethlehem, PA, USA.
Jeff. P. Simmons
Affiliation:
Air Force Research Laboratory, Wright-Patterson AFB, OH, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 188 - 189
Copyright
© Microscopy Society of America 2017 

References

[1] Kak, A. C. in Princ. Comput. Tomogr. Imaging 2001). p. 275.Google Scholar
[2] Batenburg, K. J. & Sijbers, J. IEEE Trans. Image Process 20 2011). p. 2542.Google Scholar
[3] Venkatakrishnan, S., et al, in Stat. Signal Process. Work 2012). p. 2.Google Scholar
[4] Goel, N., et al, J. Appl. Phys 118 2015). p. 25.Google Scholar
[5] Crocombette, J.-P. & Gelebart, L. J. Appl. Phys 106 2009). p. 83520.Google Scholar
[6] Garcke, H., Nestler, B. & Stoth, B., Phys. D Nonlinear Phenom 115 1998). p. 87.Google Scholar
[7] Fan, D. & Chen, L.-Q. Acta Mater 45 1997). p. 611.Google Scholar