Crossref Citations
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Nevins, Mandy C.
Zotta, Matthew D.
Hailstone, Richard K.
and
Lifshin, Eric
2018.
Visualizing Astigmatism in the SEM Electron Probe.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
604.
Chilton, G.
Breton, B.C.
Holburn, D.M.
and
Caldwell, N.H.M.
2018.
Real-time Image Processing and Restoration Prototype for the SEM: Initial Steps.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
516.
Kamal, Surya
and
Hailstone, Richard K.
2022.
SEM Nano: An Electron Wave Optical Simulation for the Scanning Electron Microscope.
Microscopy and Microanalysis,
Vol. 28,
Issue. 2,
p.
441.