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Resolution Versus Error for Computational Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Lorenzo Luzi ,
Andrew Stevens ,
Hao Yang  and
Nigel D. Browning
Lorenzo Luzi
Affiliation:
Pacific Northwest National Laboratory, Richland, WAUSA
Andrew Stevens
Affiliation:
Pacific Northwest National Laboratory, Richland, WAUSA Duke University, ECE, Durham, NCUSA
Hao Yang
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CAUSA
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratory, Richland, WAUSA University of Washington, Materials Science and Engineering, Seattle, WAUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 88 - 89
Copyright
© Microscopy Society of America 2017 

References

[1] Stevens, A, Yang, H, Carin, L, et al, Microscopy 63(1 2014). pp 41.Google Scholar
[2] Stevens, A, Kovarik, L, Abellan, P, et al, Advanced Structural and Chemical Imaging 1(1 2015). pp 1.Google Scholar
[3] Zhou, M, Chen, H, Paisley, J, et al, Image Processing, IEEE Transactions on 21(1 2012). pp 130.Google Scholar
[4] Liepin’sh, V. Y. Automatic control and computer sciences 30(3 1996). pp 20.Google Scholar
[5] Van Heel, M. & Schatz, M. Journal of structural biology 151(3 2005). pp 250.CrossRefGoogle Scholar
[6] Supported by the Chemical Imaging, Signature Discovery, and Analytics in Motion initiatives at PNNL. PNNL is operated by Battelle Memorial Inst. for the US DOE; contract DE-AC05-76RL01830.Google Scholar