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Volume 15 - April 2009

Contents

Page 16 of 47

Instrumentation and Techniques

Quantitative Atom-Probe Tomography

Abstract

  • Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography

  • TJ Prosa, D Lawrence, D Olson, DJ Larson, EA Marquis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 298-299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Field Evaporation of Octadecanethiol

  • TJ Prosa, S Kostrna Keeney, TF Kelly
  • Published online by Cambridge University Press:
    26 July 2009, pp. 300-301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A System for Simulation of Tip Evolution Under Field Evaporation

  • BP Geiser, DJ Larson, S Gerstl, D Reinhard, TF Kelly, TJ Prosa, D Olson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 302-303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atom-probe Tomography of Surface Oxides in a 20% Cold Worked Stainless Steel Tested Under PWR Primary Water Conditions

  • S Lozano-Perez, DW Saxey, EA Marquis, T Terachi, T Yamada
  • Published online by Cambridge University Press:
    26 July 2009, pp. 304-305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Analysis of Cementite in Steel by Atom Probe Tomography

  • J Takahashi, K Kawakami, Y Yamaguchi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 306-307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Femtosecond Laser Atom Probe Analysis of Rare Earth Magnets

  • T Ohkubo, Y Chen, K Nogiwa, A Nishimura, K Hono
  • Published online by Cambridge University Press:
    26 July 2009, pp. 310-311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications

Abstract

  • The Hyperion™ Ion Probe for Next Generation FIB, SIMS and Nano-Ion, Implantation

  • N Smith, P Tesch, N Martin, R Boswell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 312-313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Dual Challenges for FIBXTEM in the Era of sub-50nm Feature Sizes

  • B Tracy, J Gray, E Adem, B Phillips, A delRosario, A Myers, M Sidorov, M Guillena
  • Published online by Cambridge University Press:
    26 July 2009, pp. 314-315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fabirication of Fine Electron Biprism Filament by Focused-Ion-Beam Chemical-Vapor-Deposition

  • S Matsui, K-I Nakamatsu, K Yamamoto, T Hirayama
  • Published online by Cambridge University Press:
    26 July 2009, pp. 316-317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Beam Induced Deposition and Etching: Fundamentals, Challenges and Nanotechnology–based Applications

  • J Fowlkes, DA Smith, MG Lassiter, PD Rack
  • Published online by Cambridge University Press:
    26 July 2009, pp. 318-319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges and Opportunities for Focused Ion Beam Processing at the Nano-scale

  • J Gierak, B Schiedt, D Lucot, A Madouri, E Bourhis, G Patriarche, C Ulysse, X Lafosse, L Auvray, L Bruchhaus, R Jede
  • Published online by Cambridge University Press:
    26 July 2009, pp. 320-321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications for Argon in a Triple Beam

  • T Fujii, H Suzuki, X Man, M Hassel Shearer, M Takahashi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 322-323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Surface Area Determination of Metal Ceramic Composite by FIB Sectioning and BET Measurements

  • M Lundberg, P Stanley Jørgensen, JR Bowen, Å Persson, AK Srivastava, S Ramousse
  • Published online by Cambridge University Press:
    26 July 2009, pp. 324-325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Experimental Determination of Electron Inelastic Mean Free Path of Components in a Magnetic Read Head

  • X Xu, L Vinh, J Risner-Jamtgaard, D Yaney
  • Published online by Cambridge University Press:
    26 July 2009, pp. 326-327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond

  • W McKenzie, J Pethica, G Cross
  • Published online by Cambridge University Press:
    26 July 2009, pp. 328-329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Precision, Double XTEM Sample Preparation of Site Specific Si Nanowires

  • LM Gignac, S Mittal, S Bangsaruntip, GM Cohen, JW Sleight
  • Published online by Cambridge University Press:
    26 July 2009, pp. 330-331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials

  • H Schulz, U Zeile, JP Stodolka, D Kraft
  • Published online by Cambridge University Press:
    26 July 2009, pp. 332-333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Backside TEM Sample Preparation With The Multi-Loader Flip-Stage

  • A Buxbaum, R Schampers, J-J Bolt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 334-335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens

  • B Van Leer, LA Giannuzzi, Y-C Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 336-337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 16 of 47