Physical Sciences Symposia
Defects in Materials: How We See and Understand Them
Cores of 1/2< 110 >-type dislocations in the CrMnFeCoNi high-entropy alloy investigated by STEM, the center of symmetry and the Nye tensor mapping techniques
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- 30 July 2021, pp. 3098-3099
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Disconnection-mediated twin junction migration mechanism in FCC metals
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- 30 July 2021, pp. 3100-3102
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Direct electron imaging of dislocation activities in nanocrystalline molybdenum nanopillars
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- 30 July 2021, pp. 3104-3105
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Advanced Characterization of Components Fabricated by Additive Manufacturing
Shear-Deformation-Induced Modification of Defect Structures and Hierarchical Microstructures in Miscible and Immiscible Alloys
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- 30 July 2021, pp. 3106-3108
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Utilizing a Dynamic Segmentation Convolutional Neural Network for Microstructure Analysis of Additively Manufactured Superalloy 718
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- 30 July 2021, pp. 3110-3112
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Direct Synthesis of ZIF-8 on Transmission Electron Microscopy Grids Allows Structure Analysis and 3D Reconstruction
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- 30 July 2021, pp. 3114-3116
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Nanostructure Evolution in AA7075 Alloy Produced by Solid State Additive Manufacturing – Additive Friction Stir - Deposition
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- 30 July 2021, pp. 3118-3119
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Correlative Microscopy and Spectroscopy for Characterization of Laser-Based Additive Manufactured Materials
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- 30 July 2021, pp. 3120-3121
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Fast and Ultrafast Dynamics Using Electron Microscopy
Extreme Light-Matter Interactions in the Ultrafast Transmission Electron Microscope
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- 30 July 2021, p. 3122
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Catching them in Action: Ultrafast Transmission Electron Microscopy
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- 30 July 2021, pp. 3124-3126
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Capturing Laser Induced Dynamics of Reactive Materials via Ultrafast Transmission Electron Microscopy
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- 30 July 2021, pp. 3128-3129
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Imaging of localized surface plasmonic field at nanoscale by UEM
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- 30 July 2021, pp. 3130-3131
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High-Q photonic chip-based temporal phase plates for electron microscopy
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- 30 July 2021, pp. 3132-3133
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Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM
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- 30 July 2021, pp. 3134-3136
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Development of high-temperature electrochemical TEM and its application on solid oxide electrolysis cells
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- 30 July 2021, pp. 3138-3139
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Electron Microscopy Characterization of Sargassum Spp. from the Mexican Caribbean for Application as a Bioconstruction Material
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- 30 July 2021, pp. 3140-3143
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Universality and Scaling in Relations Between the Plasmon Energy and Solid-State Parameters: Viewing Nanoscale Properties of Battery Materials
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- 30 July 2021, pp. 3144-3146
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STEM Analysis of Cycled Model Li -ion Battery Cathode Grown by MBE.
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- 30 July 2021, pp. 3148-3150
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Low Dose Structural Analysis of Fragile Materials by Three-Dimensional Electron Diffraction
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- 30 July 2021, pp. 3152-3153
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Analytical Sciences Symposia
Microscopy and Microanalysis for Real World Problem Solving
A Best Known Method to Effectively Differentiate Elements with XEDS Peaks Overlapping for High-Volume Manufacturing of Semiconductor Device at Wafer Foundries
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- 30 July 2021, pp. 3154-3155
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