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High-Q photonic chip-based temporal phase plates for electron microscopy

Published online by Cambridge University Press:  30 July 2021

Armin Feist ,
Arslan Sajid Raja ,
Jan-Wilke Henke ,
Junqiu Liu ,
Germaine Arend ,
Guanhao Huang ,
Fee Jasmin Kappert ,
Rui Ning Wang ,
Jiahe Pan  and
Ofer Kfir
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Armin Feist
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Arslan Sajid Raja
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Jan-Wilke Henke
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Junqiu Liu
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Germaine Arend
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Guanhao Huang
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Fee Jasmin Kappert
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Rui Ning Wang
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Jiahe Pan
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Ofer Kfir
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Tobias Kippenberg
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Claus Ropers
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, Goettingen, Niedersachsen, Germany

Abstract

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Type
Fast and Ultrafast Dynamics Using Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3132 - 3133
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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