Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-25T19:48:54.742Z Has data issue: false hasContentIssue false

Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM

Published online by Cambridge University Press:  30 July 2021

Ute Golla-Schindler
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, Aalen, Germany
Irene Wacker
Affiliation:
2. Centre for Advanced Materials (CAM), University Heidelberg, Heidelberg, Germany, United States
Bernd Schindler
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany, United States
Ralf Löffler
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Dagmar Goll
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Gerhard Schneider
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Rasmus R. Schröder
Affiliation:
2. Centre for Advanced Materials (CAM), University Heidelberg, Heidelberg, Germany, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Böngeler, R. et al. , Scanning 15 (1993) p. 1-18Google Scholar
Schröder, R.R. et al. , Microscopy and Microanalysis 24 (2018) p. 626Google Scholar
Golla-Schindler, U. et al. , Microscopy and Microanalysis 25 (2019) p. 448CrossRefGoogle Scholar
Golla-Schindler, U. et al. , Micron 113 (2018) p. 10-19Google Scholar
We thank the Centre for Advanced Materials and ZEISS GmbH for the DELTA images. I. Wacker is member and R,R. Schröder is PI of the Cluster of Excellence “3D Matter Made to Order” (EXC-2082/1 – 390761711) under Germany's Excellence Strategy.Google Scholar