Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Customized Automation of Routine EPMA Analyses Using Vendor-Supplied APIs

A new beam alignment method in SEM based on parallax principle

Machine Learning for Automated Analysis of Asbestos Fibres

Automatic Status Checks and Recovery for Tundra Microscope

Rapid and Flexible Few Shot Learning-Based Classification of Scanning Transmission Electron Microscopy Data

Bayesian Approaches to Finding the Needles in the Microscopy Haystack

Adaptive Focused Ion Beam Milling through Machine Learning Algorithm Integration

EELSpecNet: Deep Convolutional Neural Network Solution for Electron Energy Loss Spectroscopy Deconvolution

An Information Technology Solution to Enable Remote Training and Operation of Instruments with Out-dated Operating Systems

Rapid Holographic Display of 3D Nanomaterials

Vendor Symposium

Development of High Throughput Cryo Electron Microscope with Cold Field Emission Gun (CRYO ARMTM 300Ⅱ)

Design and Construction of a Custom-Made and Inexpensive Glow Discharge System for TEM Applications

CETA-F: Scintillator camera for Entry level 100kV Single Particle Analysis

In situ Comparative heating and simultaneous multi-detector imaging at high and ultra-low landing energies

Two New Evactron® Plasma Cleaners for Small Chambers and UHV Systems

Can an iPhone save your life? Multimodal forensic analysis of bullet damage to a smartphone

Plasma cleaning reliability over pressure and power ranges

Cryo-SEM as an effective method for avoiding contamination

Data Management, Version Control, and Multiformat Analysis in Electron Microscopy

H5OINA: Oxford Instruments’ data exchange file format for microanalysis

Unresolved Challenges in Quantitative X-ray Microanalysis

BadgerFilm: a versatile thin film analysis program for EPMA and more

Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Vendor Symposium

Data Management, Version Control, and Multiformat Analysis in Electron Microscopy

Unresolved Challenges in Quantitative X-ray Microanalysis