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Adaptive Focused Ion Beam Milling through Machine Learning Algorithm Integration

Published online by Cambridge University Press:  30 July 2021

Max Turnquist
Affiliation:
Draper, United States
Peter Lewis
Affiliation:
Draper, United States
Troy Lau
Affiliation:
Draper, United States
Elizabeth Brundage
Affiliation:
Draper, United States
Andrew Magyar
Affiliation:
Draper, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America