Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Microscopy and Microanalysis for Real World Problem Solving

Analysis and Characterization of Ultra High Molecular Weight Polyethylene (UHMWPE) subjected to reciprocating sliding and nanoidentation tests.

In situ study of microstructure in phase transformation of pipe line steel

Hard layers based on metal borides: Microstructure and mechanical properties

Analysis of Precipitates in the Base Metal and HAZ of a 2.25Cr-1Mo Steel

Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling

Three-dimensional ultrastructural imaging reveals the nanoscale architecture of mammalian cells

Synthesis of Heteroatom Rh–ReOx Atomically Dispersed Species on Al2O3 and Their Tunable Catalytic Reactivity in Ethylene Hydroformylation

The FIGMAS Online Database of Standards and Reference Materials – an Update

Analysis of Electrochemical Corrosion in Metal form of Ti-Ta-Sn and 316-L Screw in Hank's Solution by SEM

Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors

Direct Correlation of Transmission Electron Microscopy and Optical Microscopy for Study of Fluorescent Nanodiamonds

Advances in Analytical STEM-in-SEM

STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites

Beam broadening of keV electrons in matter calculated by numerical solution of the electron transport equation

Microstructural defects in AISI 4000 series steel subjected to a 3% NaCl corrosion process.

Evaluation method of image resolution for the aberration-corrected STEM

Nanoscale orientation mapping made easy: a new sample preparation workflow for rapid, large-area TKD analysis

AN ELECTRON MIRROR AS AN OBJECTIVE LENS OF THE TRANSMISSION ELECTRON MICROSCOPE

Calibration-less quantitative 4D-STEM imaging of amorphous samples

STEM-in-SEM highly deformed structure investigation with focus on electron-transparent specimen preparation

Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Microscopy and Microanalysis for Real World Problem Solving

Advances in Analytical STEM-in-SEM