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Volume 11 - October 2005

Contents

Page 44 of 61

High-Resolution STEM Analysis of Functional NanoMaterials

Research Article

  • HAADF Imaging and Low-Loss EELS Investigation of HfO2/TiN Interfaces in High-k Gate Stacks

  • M P Agustin, L R C Fonseca, J H Hooker, S Stemmer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1446-1447
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Investigation of Y-doping in Alumina Grain Boundaries using STEM

  • J P Buban, S Hanyu, K Matsunaga, T Yamamoto, Y Ikuhara
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1448-1449
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Imaging of Core-shell Structure in Ag-Au Nanoparticles

  • Z Y Li, J Yuan, Y Chen, R Palmer, J Wilcoxon
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1450-1451
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Imaging of Dopant-Elements Distributions in High-Strength Nanostructured Materials by Atomic-Resolution Z-Contrast STEM

  • E Abe
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1454-1455
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Shape of CdSe Quantum Rods using Quantitative ADF STEM Imaging

  • S Maccagnano, K A Mkhoyan, J Calcines, T D Krauss, J Silcox
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1458-1459
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Toward Correlation of Conductance of RuO2 Nanowire with Plasmon Energy Shift

  • Y-L Liu, F-R Chen, J-J Kai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1460-1461
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Size Confinement Effects in AgX Nanocrystals as Studied by Cryo-EFTEM and EELS

  • V P Oleshko
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1462-1463
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Domain Structures in La0.8Ca0.2CoO3 Perovskites

  • M Chi, N D Browning, N Orlovskaya
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1464-1465
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Low Energy-Loss Spectroscopic Studies of Grain Boundary Cores in Complex Oxides.

  • T J Pennycook, M Varela, K van Benthem, S J Pennycook
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1466-1467
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Evidence of Shelled Structures of Au-Pd Bimetallic Nano-Particles

  • J-P Zhang, D T Foord, J Chou, E W McFarland
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1468-1469
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Transmission Electron Microscopic Study of CuO/ZnO Nanostructured Catalyst

  • J-G Zheng, N Wu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1470-1471
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Electronic Structure of Manganese Doped Ceramic Material Ba0.6Sr0.4TiO3

  • K X Hu, I P Jones
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1472-1473
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Improving Resolution of HAADF STEM Images with Maximum Entropy Method and Deconvolution Processing

  • Y Kotaka, N Nakanishi, T Yamazaki, K Watanabe, I Hashimoto
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1476-1477
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in In-situ Electron Microsocpy Technique and Applications

Research Article

  • Dynamic Observation of Vortices in High- Tc Superconductors by Lorentz Microscopy

  • A Tonomura
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1478-1479
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Optical Requirements for Sub-Nanosecond Microscopy

  • B W Reed, M Armstrong, W E King
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1480-1481
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High-Speed, High-DQE Detectors For Electron Microscopy

  • P Denes, J M Bussat, H von der Lippe, V Radmilovic
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1482-1483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Reaction of Co with Ge Studied by In-situ TEM

  • H P Sun, Y B Chen, D Z Chi, R Nath, Y Foo, X Q Pan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1484-1485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 44 of 61