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Characterization of Epitaxial Semimetallic ErAs Particles in an In0.53Ga0.47As Matrix by High-Angle Annular Dark-Field Imaging

Published online by Cambridge University Press:  01 August 2005

D O Klenov ,
D C Driscoll ,
J D Zimmerman ,
J D Zide ,
A C Gossard  and
S Stemmer
D O Klenov
Affiliation:
University of California,Santa Barbara
D C Driscoll
Affiliation:
University of California,Santa Barbara
J D Zimmerman
Affiliation:
University of California,Santa Barbara
J D Zide
Affiliation:
University of California,Santa Barbara
A C Gossard
Affiliation:
University of California,Santa Barbara
S Stemmer
Affiliation:
University of California,Santa Barbara

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1456 - 1457
Copyright
© 2005 Microscopy Society of America