Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-30T01:38:59.472Z Has data issue: false hasContentIssue false
  • English
  • Français

Single-Layer and Multilayer Partially Stabilized Zirconia-Yttria Nanostructured Films Characterization by SEM, AFM, TEM and EDS

Published online by Cambridge University Press:  01 August 2005

I Espitia-Cabrera ,
H D Orozco-Hernández ,
L Martínez-Gómez  and
M E Contreras-GarcÌa
I Espitia-Cabrera
Affiliation:
Universidad Michoacana de San Nicolás de Hidalgo,Mexico
H D Orozco-Hernández
Affiliation:
Universidad Michoacana de San Nicolás de Hidalgo,Mexico
L Martínez-Gómez
Affiliation:
Centro de Ciencias Físicas,Mexico
M E Contreras-GarcÌa
Affiliation:
Universidad Michoacana de San Nicolás de Hidalgo,Mexico

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1474 - 1475
Copyright
© 2005 Microscopy Society of America