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Influence of Electron Beam Energy and Dose on In Situ Electron Microscopy Studies for Direct Correlation between Structure and Properties

Published online by Cambridge University Press:  05 August 2019

Eva Olsson
Eva Olsson*
Affiliation:
Department of Physics, Chalmers University of Technology, 412 96 Gothenburg, Sweden.
*
*Corresponding author: [email protected]

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 452 - 453
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]The author acknowledges funding from the Swedish Research Council, the Swedish Energy Agency, Chalmers Area of Advance Materials Science, Chalmers Excellence Initiative Nano and the Knut and Alice Wallenberg Foundation. The work was performed in part at Chalmers Materials Analysis Laboratory.Google Scholar