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Using the EDS Clues: Peak Fitting Residual Spectrum and Analytical Total

Published online by Cambridge University Press:  05 August 2019

Dale E. Newbury  and
Nicholas W. M. Ritchie
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8370
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8370

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 446 - 447
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Goldstein, J.I., Newbury, D.E., Michael, J.R., Ritchie, N.W.M., Scott, J.H.J., and Joy, D.C., Scanning Electron Microscopy and X-ray Microanalysis, 4th ed. (Springer, New York, 2018).Google Scholar
[2]Castaing, R., Ph. D. Thesis, “Application of electron probes to local chemical and crystallographic analysis,” University of Paris (1951).Google Scholar
[3]Ritchie, N.W.M. (2018). NIST DTSA-II software, including tutorials. Available for free at: www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html (retrieved November 27, 2018).Google Scholar