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Volume 17 - February 2011

Contents

Page 26 of 58

Instrumentation and Techniques

Focused Ion Beam

Abstract

  • Direct Imaging of Microstructural Changes in Si Induced by FIB-Patterning with Si++ and Ga+ Ions

  • S Chee, M Kammler, J Graham, F Ross, R Hull
  • Published online by Cambridge University Press:
    08 April 2017, pp. 656-657
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling

  • H Stegmann, H Dömer, R Rosenkranz, E Zschech
  • Published online by Cambridge University Press:
    08 April 2017, pp. 658-659
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Contrast Performance: Low Voltage Electrons vs. Helium Ions

  • D Bell
  • Published online by Cambridge University Press:
    08 April 2017, pp. 660-661
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells

  • C Xiao, R Minqin, C Ce-Belle, C Udalagama, A Bettiol, F Ee, L Yue, F Watt
  • Published online by Cambridge University Press:
    08 April 2017, pp. 662-663
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A Closer Look at the Brain in 3D Using FIB-SEM

  • C Xu, H Hess
  • Published online by Cambridge University Press:
    08 April 2017, pp. 664-665
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Serial Sectioning in SEM: Challenges and Opportunities

  • A Avishai, N Avishai, G Kidd, K Olszens, D McDonald, S Duarte, D Mustafi, K Palczewski, S Frase, A Heuer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 666-667
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Application of Cryo FIB SEM for Nano-EHS Studies

  • K Scott
  • Published online by Cambridge University Press:
    08 April 2017, pp. 668-669
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future

  • R Livengood, S Tan, P Hack, M Kane, Y Greenzweig
  • Published online by Cambridge University Press:
    08 April 2017, pp. 672-673
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Experimental Observations on FIB Milling using a Custom Software Interface

  • N Caldwell, J Poole, B Breton, D Holburn
  • Published online by Cambridge University Press:
    08 April 2017, pp. 674-675
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Aspects of Beam Control for Single and Dual Beam Systems

  • K Lagarec, A Laquerre, M Phaneuf
  • Published online by Cambridge University Press:
    09 April 2017, pp. 676-677
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Site Specific Focused Ion Beam (FIB) Sample Preparation of Penetrative Oxidation in Ni-Base Alloys for 3DAPT Analysis

  • M Olszta, L Thomas, S Bruemmer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 678-679
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Effect of Crystallinity on Materials Removal Rate of Polyolefins During Ga+ Focused Ion Beam Nanomachining

  • K Wong, A Batchelor, C Balik, D Griffis
  • Published online by Cambridge University Press:
    09 April 2017, pp. 680-681
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion

  • K Grossklaus, J Millunchick
  • Published online by Cambridge University Press:
    08 April 2017, pp. 682-683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Focused Ion Beam Hard Mask Mechanism

  • W McKenzie, P Munroe
  • Published online by Cambridge University Press:
    08 April 2017, pp. 684-685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of a Cryo-Air Protection Holder for FIB/(S)TEM

  • Y Kuroda, M Kudo, A Morikawa, T Sato, T Iwahori, T Agemura
  • Published online by Cambridge University Press:
    08 April 2017, pp. 688-689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique

  • X Wang, R Lockwood, D Vick, A Meldrum, M Malac
  • Published online by Cambridge University Press:
    08 April 2017, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Three Dimensional Characterization of Cells in Hydrogel with Focused Ion Beam

  • A Al-Abboodi, J Fu, P Chan, P Doran
  • Published online by Cambridge University Press:
    08 April 2017, pp. 692-693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Preparation of 2-D Sections of Li-ion Battery Electrode Architectures with a Focused Ion Beam and Modeling

  • E Gorzkowski, D Rowenhorst, D Stephenson, D Wheeler
  • Published online by Cambridge University Press:
    08 April 2017, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 26 of 58