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Volume 17 - February 2011

Contents

Page 25 of 58

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

  • Industrial Applications of Electron Probe Microanalysis (EPMA)

  • S Goresh
  • Published online by Cambridge University Press:
    08 April 2017, pp. 616-617
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Environmental NanoBiology: Structural Evaluation Of Naturally Occurring Transition Metal Oxide-Containing Surface Films From Freshwaters

  • R Smith, E Sánchez
  • Published online by Cambridge University Press:
    08 April 2017, pp. 618-619
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Windowless Silicon Drift Detectors

  • R Anderhalt, A Sandborg
  • Published online by Cambridge University Press:
    08 April 2017, pp. 620-621
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advances In Microscopy and Microanalysis in the Field of Forensic Firearm Examination and Identification

  • D Lamagna
  • Published online by Cambridge University Press:
    08 April 2017, pp. 622-623
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Improving Analytical Spatial Resolution with the JEOL Field Emission Electron Microprobe

  • P McSwiggen, N Mori, M Takakura, C Nielsen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 624-625
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Focused Ion Beam

Abstract

  • Advanced FIB Sample Preparation for High Performance TEM Analysis

  • F Altmann, R Salzer, M Simon, S Huebner, C Grosse, A Graff
  • Published online by Cambridge University Press:
    08 April 2017, pp. 626-627
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas

  • L Lechner, J Biskupek, U Kaiser
  • Published online by Cambridge University Press:
    08 April 2017, pp. 628-629
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

  • R Cerchiara, P Fischione, J Liu, J Matesa, A Robins
  • Published online by Cambridge University Press:
    08 April 2017, pp. 632-633
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advanced Physical Failure Analysis Techniques Using 3D Rotation Imaging from Plane-View TEM Sample

  • H-J Kang, J-G Gwak, T-S Park, T-S Back, H-J Kim, O Han
  • Published online by Cambridge University Press:
    08 April 2017, pp. 634-635
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Focus Ion Beam for Cross-Sectional TEM Specimen Preparation of Nanomaterials

  • J-G Zheng, S Xie
  • Published online by Cambridge University Press:
    08 April 2017, pp. 636-637
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates

  • F Rivera, J Abbott, R Davis, R Vanfleet
  • Published online by Cambridge University Press:
    08 April 2017, pp. 638-639
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In Situ Probe Approaches for Charge Reduction, Sample Manipulation, and Modified Total Release Lift-out

  • K Langworthy, J Ditto, C Hartfield, D Krinsley
  • Published online by Cambridge University Press:
    08 April 2017, pp. 640-641
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • On-Probe Thinning of Samples for Bulk or STEM Type EDS Analysis

  • C Hartfield, B Miller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 642-643
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Cryo-FIB Machining: An Alternative to TEM Cryo-Sections Cut with Diamonds?

  • M Hayles, M de Winter, C Schneijdenberg, J Meeldijk, H Persoon, U Luecken, A Verkleij, B Humbel
  • Published online by Cambridge University Press:
    08 April 2017, pp. 644-645
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • TEM Specimen Preparation with Plasma FIB Xe+ Ions

  • L Giannuzzi, N Smith
  • Published online by Cambridge University Press:
    09 April 2017, pp. 646-647
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Large Volume High Resolution FIB Nanotomography

  • J Huang
  • Published online by Cambridge University Press:
    08 April 2017, pp. 648-649
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Hyperion Plasma FIB for Precision 3D TSV Analysis

  • N Smith, P Tesch, N Martin, R Boswell
  • Published online by Cambridge University Press:
    08 April 2017, pp. 650-651
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • An Aberration Corrected FIB for Nano-Area Mass Spectrometry

  • S Itose, M Matsuya, S Uno, K Yamashita, S Ebata, M Ishihara, K Uchino, H Yurimoto, K Sakaguchi, M Kudo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 654-655
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 25 of 58