Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling

H Stegmann; H Dömer; R Rosenkranz; E Zschech

doi:10.1017/S1431927611004168

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Zschech, Ehrenfried Gluch, Jürgen Rosenkranz, Rüdiger Standke, Yvonne and Niese, Sven 2016. FIB sample preparation for X-ray microscopy and ROI target cross-sectioning. Microscopy and Microanalysis, Vol. 22, Issue. S3, p. 168.

Zschech, E. Löffler, M. Krüger, P. Gluch, J. Kutukova, K. Zgłobicka, I. Silomon, J. Rosenkranz, R. Standke, Y. and Topal, E. 2018. Laboratory Computed X-Ray Tomography – A Nondestructive Technique for 3D Microstructure Analyis of Materials. Practical Metallography, Vol. 55, Issue. 8, p. 539.

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Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling

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