Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-30T06:45:43.863Z Has data issue: false hasContentIssue false
  • English
  • Français

Expanding the Boundaries of FIB-SEM Technology: Developments for Best Application Results

Published online by Cambridge University Press:  09 October 2013

I. Schulmeyer  and
M. Kienle
I. Schulmeyer
Affiliation:
M. Kienle
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1308 - 1309
Copyright
Copyright © Microscopy Society of America 2013